1. Digital circuit testing and testability
پدیدآورنده : Lala, Parag K.
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Integrated circuits-- Very large scale integration-- Testing,، Digital integrated circuits-- Testing,، Integrated circuits-- Fault tolerance
رده :
TK
7874
.
75
.
L35
1997
